Aehr Test Systems (NASDAQ:AEHR) Stock Crosses Above Two Hundred Day Moving Average of $1.57

Aehr Test Systems (NASDAQ:AEHR)’s stock price passed above its 200-day moving average during trading on Wednesday . The stock has a 200-day moving average of $1.57 and traded as high as $1.78. Aehr Test Systems shares last traded at $1.78, with a volume of 16,888 shares trading hands.

The company has a debt-to-equity ratio of 0.14, a current ratio of 4.03 and a quick ratio of 2.00. The company’s 50-day moving average is $1.59 and its 200 day moving average is $1.57.

In other Aehr Test Systems news, Director Mario M. Rosati sold 41,918 shares of the stock in a transaction that occurred on Tuesday, October 8th. The shares were sold at an average price of $1.67, for a total value of $70,003.06. Following the completion of the sale, the director now owns 35,619 shares in the company, valued at approximately $59,483.73. The transaction was disclosed in a legal filing with the SEC, which can be accessed through this link. 16.30% of the stock is owned by corporate insiders.

An institutional investor recently bought a new position in Aehr Test Systems stock. River & Mercantile Asset Management LLP bought a new position in Aehr Test Systems (NASDAQ:AEHR) in the second quarter, according to the company in its most recent filing with the Securities and Exchange Commission. The institutional investor bought 269,438 shares of the semiconductor company’s stock, valued at approximately $445,000. River & Mercantile Asset Management LLP owned approximately 1.19% of Aehr Test Systems as of its most recent SEC filing. 26.87% of the stock is owned by institutional investors.

Aehr Test Systems Company Profile (NASDAQ:AEHR)

Aehr Test Systems primarily designs, engineers, manufactures, and sells test and burn-in equipment for use in the semiconductor industry worldwide. It provides full wafer contact test systems, test during burn-in systems, test fixtures, and related accessories. The company offers Advanced Burn-in and Test System family of packaged part burn-in and test systems, which perform test during burn-in of complex devices, such as digital signal processors, microprocessors, microcontrollers, and systems-on-a-chip, as well as individual temperature control for high-power advanced logic devices.

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